AN INTENSE ELECTRON BEAM SOURCEYEHESKEL J; GAZIT D; AVIDA R et al.1983; JOURNAL OF PHYSICS D: APPLIED PHYSICS; ISSN 0022-3727; GBR; DA. 1983; VOL. 16; NO 4; PP. 499-504; BIBL. 5 REF.Article

ANALYSIS OF PARALLEL SCHOTTKY CONTACTS BY DIFFERENTIAL INTERNAL PHOTOEMISSION SPECTROSCOPYOKUMURA T; TU KN.1983; JOURNAL OF APPLIED PHYSICS; ISSN 0021-8979; USA; DA. 1983; VOL. 54; NO 2; PP. 922-927; BIBL. 14 REF.Article

INFLUENCE OF EXTRAPOLATION OF THE INTERFERENCE FUNCTION OF AMORPHOUS PD₈₃SI₁₇ ON THE RADIAL DISTRIBUTION FUNCTIONCERVEN I; WEIS J.1982; PHYSICA STATUS SOLIDI. (A). APPLIED RESEARCH; ISSN 0031-8965; DDR; DA. 1982; VOL. 72; NO 2; PP. K181-K184; BIBL. 5 REF.Article

MATERIAL REACTIONS AL/PD₂SI/SI JUNCTIONS. II: KINETIC RATESHO PS; LEWIS JE; KOSTER U et al.1982; JOURNAL OF APPLIED PHYSICS; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 11; PART. 1; PP. 7445-7449; BIBL. 13 REF.Article

IDEAL ELASTIC, ANELASTIC AND VISCOELASTIC DEFORMATION OF A METALLIC GLASSTAUB AI; SPAEPEN F.1981; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1981; VOL. 16; NO 11; PP. 3087-3092; BIBL. 22 REF.Article

THE TERMAL STABILITY OF VERY THIN PD_D2SI FILMS ON SITROMP RM; VAN LOENEN EJ; IWAMI M et al.1983; SURFACE SCIENCE; ISSN 0039-6028; NLD; DA. 1983; VOL. 128; NO 2-3; PP. 224-236; BIBL. 18 REF.Article

ELECTRON MICROSCOPE STUDIES OF THE STRUCTURE AND PROPAGATION OF THE PD₂SI/(111)SI INTERFACECHERNS D; SMITH DA; KRAKOW W et al.1982; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1982; VOL. 45; NO 1; PP. 107-125; BIBL. 12 REF.Article

POSITRON LIFETIME MEASUREMENTS ON ELECTRON IRRADIATION DAMAGE IN AMORPHOUS PD₈₀SI₂₀ AND CU₅₀TI₅₀ ALLOYSYLI KAUPPILA J; MOSER P; KUNZI H et al.1982; APPL. PHYS., A, SOLIDS SURF.; DEU; DA. 1982; VOL. 27; NO 1; PP. 31-33; BIBL. 11 REF.Article

CREEP, STRESS RELAXATION AND STRUCTURAL CHANGE OF AMORPHOUS ALLOYS = FLUAGE, RELAXATION DE CONTRAINTE ET MODIFICATION STRUCTURALE DES ALLIAGES AMORPHESTAUB AI; LUBORSKY FE.1981; ACTA METALL.; ISSN 0001-6160; USA; DA. 1981; VOL. 29; NO 12; PP. 1939-1948; ABS. FRE/GER; BIBL. 37 REF.Article

LASER BEAM INTERACTION WITH THE PD-SI-CU EUTECTICYATSUYA; MASSALSKI TB.1982; MATER. SCI. ENG.; ISSN 0025-5416; CHE; DA. 1982; VOL. 54; NO 1; PP. 101-111; BIBL. 17 REF.Article

THE STRUCTURE OF LIQUID EUTECTIC PD-SI BY X-RAY AND NEUTRON STUDY = LA STRUCTURE DE L'EUTECTIQUE LIQUIDE PD-SI PAR ETUDE RX ET DE NEUTRONSANDONOV P; BELLISSENT FUNEL MC; BELLISSENT R et al.1982; JOURNAL OF PHYSICS F: METAL PHYSICS; ISSN 0305-4608; GBR; DA. 1982; VOL. 12; NO 12; PP. 2757-2766; BIBL. 31 REF.Article

KRISTALLSTRUKTURDATEN DER METASTABILEN PHASE (PD,SI)AL₂(M) = DONNEES DE STRUCTURE CRISTALLINE DE LA PHASE METASTABLE (PD,SI)AL₂(M)ELLNER M; KATTNER U; PREDEL B et al.1982; J. LESS-COMMON MET.; ISSN 0022-5088; CHE; DA. 1982; VOL. 85; NO 1; PP. L1-L4; BIBL. 13 REF.Article

LATTICE IMAGING OF SILICIDE-SILICON INTERFACES AND THE INTERPRETATION OF INTERFACIAL DEFECTSFOLL H.1982; PHYSICA STATUS SOLIDI. (A). APPLIED RESEARCH; ISSN 0031-8965; DDR; DA. 1982; VOL. 69; NO 2; PP. 779-788; ABS. GER; BIBL. 21 REF.Article

High-reliability interconnections for ULSI using Al-Si-Pd-Nb/Mo layered filmsONUKI, J; KOUBUCHI, Y; SUWA, M et al.I.E.E.E. transactions on electron devices. 1992, Vol 39, Num 6, pp 1322-1326, issn 0018-9383Article

EQUILIBRIUM SILICIDES OF PALLADIUM = SILICIURES DE PALLADIUM A L'EQUILIBREWYSOCKI JA; DUWEZ PE.1981; METALL. TRANS. A; ISSN 0360-2133; USA; DA. 1981; VOL. 12; NO 8; PP. 1455-1460; BIBL. 16 REF.Article

EVOLUTION STRUCTURALE D'ALLIAGES PD-SI AMORPHES EN FONCTION DE LA TEMPERATURE = STRUCTURAL EVOLUTION OF AMORPHOUS PD-SI ALLOY AS A FUNCTION OF TEMPERATURESADOC JF; LARIDJANI M.1981; J. PHYS.; ISSN 0302-0738; FRA; DA. 1981; VOL. 42; NO 22; PP. L485-L489; ABS. ENG; BIBL. 6 REF.Article

EPITAXIAL GROWTH OF PD₂SI FILMS ON SI(111) SUBSTRATES BY SCANNING ELECTRON-BEAM ANNEALINGISHIWARA H; YAMAMOTO H.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 41; NO 8; PP. 718-720; BIBL. 8 REF.Article

SEVERE RADIATION DAMAGE BY HEAVY IONS IN GLASSY PD₈₀SI₂₀KLAUMUENZER S; SCHUMACHER G; RENTZSCH S et al.1982; ACTA METALL.; ISSN 0001-6160; USA; DA. 1982; VOL. 30; NO 8; PP. 1493-1502; ABS. FRE/GER; BIBL. 33 REF.Article

CHARACTERISATION OF MODELS OF MULTICOMPONENT AMORPHOUS METALS: THE RADICAL ALTERNATIVE TO THE VORONOI POLYHEDRON = CARACTERISATION DES MODELES DES METAUX AMORPHES A COMPOSANTS MULTIPLES: LE RADICAL ALTERNATIF AU POLYEDRE DE VORONOIGELLATLY BJ; FINNEY JL.1982; JOURNAL OF NON-CRYSTALLINE SOLIDS; ISSN 0022-3093; NLD; DA. 1982; VOL. 50; NO 3; PP. 313-329; BIBL. 9 REF.Article

Mechanical alloying of the Pd-Si system in controlled conditions of energy transferPADELLA, F; PARADISO, E; BURGIO, N et al.Journal of the less-common metals. 1991, Vol 175, Num 1, pp 79-90, issn 0022-5088Article

A comparison of viscous flow in sputtered and melt-quenched amorphous Pd-Si alloysVOLKERT, C. A; SPAEPEN, F.Scripta metallurgica. 1990, Vol 24, Num 3, pp 463-468, issn 0036-9748Article

SAXS STUDY ON THE STRUCTURE AND CRYSTALLIZATION OF AMORPHOUS METALLIC ALLOYS = ETUDE PAR DIFFUSION CENTRALE DE RAYONS X (SAXS) DE LA STRUCTURE ET DE LA CRISTALLISATION DES ALLIAGES METALLIQUES AMORPHESOSAMURA K; SHIBUE K; SUZUKI R et al.1981; COLLOID POLYM. SCI.; ISSN 0303-402X; DEU; DA. 1981; VOL. 259; NO 6; PP. 677-682; BIBL. 9 REF.Article

SURFACE STRUCTURE OF EPITAXIAL PD₂SI THIN FILMS = STRUCTURE DE SURFACE DE COUCHES MINCES EPITAXIQUES DE PD₂SIOURA K; OKADA S; KISHIKAWA Y et al.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 40; NO 2; PP. 138-140; BIBL. 25 REF.Article

COMPOUNDS IN THE PD-SI AND PT-SI SYSTEM OBTAINED BY ELECTRON BOMBARDMENT AND POST-THERMAL ANNEALING = COMPOSES DANS LES SYSTEMES PD-SI ET PT-SI OBTENUS PAR BOMBARDEMENT ELECTRONIQUE ET POST-RECUIT THERMIQUEMAJNI G; NAVA F; OTTAVIANI G et al.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 6; PP. 4055-4061; BIBL. 11 REF.Article

GROWTH KINETICS OF PD₂SI FROM EVAPORATED AND SPUTTER-DEPOSITED FILMS = CINETIQUE DE CROISSANCE DE PD₂SI A PARTIR DE COUCHES MINCES EVAPOREES ET DEPOSEES PAR PULVERISATIONCHEUNG NW; NICOLET MA; WITTMER M et al.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 79; NO 1; PP. 51-60; BIBL. 16 REF.Article